Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

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Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey ...

Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces 1994, Oxford University Press, USA, New York, NY

ISBN-13: 9780195092042

Revised edition

Hardcover

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