Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

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Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas ...

Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces 1994, Oxford University Press, USA, New York, NY

ISBN-13: 9780195092042

Hardcover

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