Circuit Design for Reliability
Ricardo Reis (Editor),
Yu Cao (Editor)
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Failure Analysis of...
Lawrence C Wagner (Editor)
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Strain-Engineered Mosfets
C.K. Maiti,
T.K. Maiti
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Reliability of RoHS-compliant...
John Lau
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Design for Testability, Debug...
Sebastian Huhn,
Rolf Drechsler
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Guidebook for Managing...
Michael Pecht,
Riko Radojcic
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Testing and reliable design...
Niraj K Jha,
Sandip Kundu
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Failure-Free Integrated...
Charles Cohn,
Charles A Harper
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Integrated Circuit Quality...
Eugene R Hnatek
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Fundamentals of Reliability...
Indra Gunawan
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Rapid Reliability Assessment...
Dorey
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Terrestrial Radiation Effects...
Eishi H Ibe
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Reliability, Yield, and...
Way Kuo,
Wei-Ting Kary Chien
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Lifetime Reliability-aware...
Mohsen Raji,
Behnam Ghavami
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Yield and Variability...
Jian Cheng Zhang,
M a Styblinski
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Gate Dielectric Integrity:...
D C Gupta
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Workload Dependent Mitigation...
Ji-Yung Lin,
Michalis Noltsis
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Built-in Fault-tolerant...
Xiaowei Li,
Guihai Yan
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Sustainable Wireless Network...
Jacob Murray,
Paul Wettin
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Materials, Technology and...
R. J. Carter (Editor),
C. S. Hau-Riege (Editor)
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Esd: Failure Mechanisms and...
Dr. Steven H Voldman
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