Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relatively unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage ...
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Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relatively unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. An Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrial technology enrich and enliven the presentation throughout. In considering the applications of this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturer's product are clearly discussed, and the role of the test engineer is clearly defined.
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Add this copy of An Introduction to Mixed-Signal Ic Test and Measurement to cart. $14.58, very good condition, Sold by ThriftBooks-Reno rated 4.0 out of 5 stars, ships from Reno, NV, UNITED STATES, published 2000 by Oxford University Press.
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Add this copy of An Introduction to Mixed-Signal Ic Test and Measurement to cart. $27.72, fair condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 2000 by Oxford University Press.
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Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
Add this copy of An Introduction to Mixed-Signal Ic Test and Measurement to cart. $76.41, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2000 by Oxford University Press.
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Add this copy of An Introduction to Mixed-Signal Ic Test and Measurement to cart. $217.57, new condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2000 by Oxford University Press.