Add this copy of Computed Electron Micrographs and Defect Identification to cart. $38.10, fair condition, Sold by Anybook rated 5.0 out of 5 stars, ships from Lincoln, UNITED KINGDOM, published 1973 by North Holland Publishing Company.
Publisher:
Elsevier Science Publishing Co Inc.,U.S.
Published:
1973
Language:
English
Alibris ID:
17535592972
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Seller's Description:
Volume 7. This is an ex-library book and may have the usual library/used-book markings inside. This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item, 1000grams, ISBN: 0720417570.
