This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric technologies, it would be difficult to develop system-level test strategies that yield a high IC fault coverage. The work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. The 2nd edition of Defect Oriented Testing has been extensively updated ...
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This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric technologies, it would be difficult to develop system-level test strategies that yield a high IC fault coverage. The work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. The 2nd edition of Defect Oriented Testing has been extensively updated with the addition of chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering to provide a link between defect sources and yield. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.
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Add this copy of Defect-Oriented Testing for Nano-Metric Cmos Vlsi to cart. $175.50, new condition, Sold by Basi6 International rated 5.0 out of 5 stars, ships from Irving, TX, UNITED STATES, published 2010 by Springer.
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Fine. Trade paperback (US). Glued binding. 328 p. Frontiers in Electronic Testing, 34. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Defect-Oriented Testing for Nano-Metric CMOS VLSI to cart. $230.55, new condition, Sold by GreatBookPricesUK5 rated 5.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 2010 by Springer.
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New. Trade paperback (US). Glued binding. 328 p. Frontiers in Electronic Testing, 34. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Defect-Oriented Testing for Nano-Metric CMOS VLSI to cart. $236.86, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2010 by Springer.
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Fine. Trade paperback (US). Glued binding. 328 p. Frontiers in Electronic Testing, 34. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Defect-Oriented Testing for Nano-Metric CMOS VLSI to cart. $237.11, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2010 by Springer.
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Seller's Description:
New. Trade paperback (US). Glued binding. 328 p. Frontiers in Electronic Testing, 34. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
