This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross ... Read More
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. Read Less
Add this copy of High-Level Estimation and Exploration of Reliability to cart. $36.55, very good condition, Sold by buks4less rated 5.0 out of 5 stars, ships from Nottingham, Linby, , UNITED KINGDOM, published 2018 by Springer.
Add this copy of High-Level Estimation and Exploration of Reliability to cart. $36.55, good condition, Sold by buks4less rated 5.0 out of 5 stars, ships from Nottingham, Linby, , UNITED KINGDOM, published 2018 by Springer.
Add this copy of High-Level Estimation and Exploration of Reliability to cart. $131.02, new condition, Sold by Ria Christie Books rated 5.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 2018 by Springer.
