SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.
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SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.
Read Less
Add this copy of Introduction to Advanced System-on-Chip Test Desig to cart. $123.49, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2011 by Springer-Verlag New York Inc..
Add this copy of Introduction to Advanced System-on-Chip Test Desig to cart. $123.63, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2005 by Springer.
Add this copy of Introduction to Advanced System-on-Chip Test Desig to cart. $138.46, new condition, Sold by Basi6 International rated 5.0 out of 5 stars, ships from Irving, TX, UNITED STATES, published 2011 by Springer-Verlag New York Inc..
Add this copy of Introduction to Advanced System-on-Chip Test Desig to cart. $138.46, new condition, Sold by Basi6 International rated 5.0 out of 5 stars, ships from Irving, TX, UNITED STATES, published 2005 by Springer.
