Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
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Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Read Less
Add this copy of (Ipf)Microelectronic Reliability to cart. $202.32, new condition, Sold by Paperbackshop rated 5.0 out of 5 stars, ships from Bensenville, IL, UNITED STATES, published 1989 by Artech House Publishers.
