Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.
Read More
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.
Read Less
Add this copy of Kelvin Probe Force Microscopy to cart. $101.42, new condition, Sold by Basi6 International rated 5.0 out of 5 stars, ships from Irving, TX, UNITED STATES, published 2013 by Springer-Verlag Berlin and Heidelberg GmbH & Co. K.
Edition:
2013, Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Add this copy of Kelvin Probe Force Microscopy: Measuring and to cart. $112.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2013 by Springer-Verlag Berlin and Heidelberg GmbH & Co. K.
Edition:
2013, Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Add this copy of Kelvin Probe Force Microscopy: Measuring and to cart. $122.41, new condition, Sold by GreatBookPricesUK5 rated 5.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 2013 by Springer-Verlag Berlin and Heidelberg GmbH & Co. K.
Edition:
2013, Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Publisher:
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Published:
2013
Language:
English
Alibris ID:
18962422081
Shipping Options:
Standard Shipping: $4.90
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Contains: Unspecified. Springer Series in Surface Sciences . Includes unspecified. Intended for professional and scholarly audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Kelvin Probe Force Microscopy: Measuring and to cart. $123.46, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2013 by Springer-Verlag Berlin and Heidelberg GmbH & Co. K.
Edition:
2013, Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Publisher:
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Published:
2013
Language:
English
Alibris ID:
18962333423
Shipping Options:
Standard Shipping: $4.90
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Contains: Unspecified. Springer Series in Surface Sciences . Includes unspecified. Intended for professional and scholarly audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Kelvin Probe Force Microscopy: Measuring and to cart. $142.09, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2013 by Springer.
Edition:
2013, Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Add this copy of Kelvin Probe Force Microscopy: Measuring and to cart. $182.80, new condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2013 by Springer.
Edition:
2013, Springer-Verlag Berlin and Heidelberg GmbH & Co. K
