This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.
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This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.
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Add this copy of Multi-run Memory Tests for Pattern Sensitive Faults to cart. $58.20, new condition, Sold by GreatBookPricesUK5 rated 5.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 2018 by Springer International Publishing AG.
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Add this copy of Multi-Run Memory Tests for Pattern Sensitive Faults to cart. $60.65, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2019 by Springer.
Add this copy of Multi-run Memory Tests for Pattern Sensitive Faults to cart. $60.65, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2018 by Springer International Publishing AG.
Add this copy of Multi-Run Memory Tests for Pattern Sensitive Fault to cart. $62.95, new condition, Sold by Basi6 International rated 5.0 out of 5 stars, ships from Irving, TX, UNITED STATES, published 2019 by Springer.
Add this copy of Multi-Run Memory Tests for Pattern Sensitive Fault to cart. $62.95, new condition, Sold by Basi6 International rated 5.0 out of 5 stars, ships from Irving, TX, UNITED STATES, published 2018 by Springer International Publishing AG.
Add this copy of Multi-Run Memory Tests for Pattern Sensitive Fault to cart. $43.28, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2019 by Springer.
Add this copy of Multi-Run Memory Tests for Pattern Sensitive Fault to cart. $43.42, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2018 by Springer International Publishing AG.
Add this copy of Multi-Run Memory Tests for Pattern Sensitive Fault to cart. $43.70, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2019 by Springer.
