This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.
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This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.
Read Less
Add this copy of Multi-Run Memory Tests for Pattern Sensitive Fault to cart. $44.05, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2019 by Springer.
Add this copy of Multi-Run Memory Tests for Pattern Sensitive Fault to cart. $44.19, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2018 by Springer International Publishing AG.
