As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating ... Read More
As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable. This is a softcover version of PM24. Read Less
Add this copy of Optical Scattering: Measurements and Analysis to cart. $52.96, very good condition, Sold by HPB-Diamond rated 4.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 2012 by Society of Photo Optical.
Edition:
2012, SPIE-International Society for Optical Engineering
Publisher:
SPIE-International Society for Optical Engineering
Published:
2012
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English
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18999362537
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Edition:
2012, SPIE-International Society for Optical Engineering
Publisher:
SPIE-International Society for Optical Engineering
Published:
2012
Language:
English
Alibris ID:
18957598102
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Edition:
1995, SPIE-International Society for Optical Engineering
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Edition:
1995, SPIE-International Society for Optical Engineering
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SPIE-International Society for Optical Engineering
Published:
1995
Language:
English
Alibris ID:
18977434215
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Edition:
1995, SPIE-International Society for Optical Engineering
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