Consists of over 200 papers by acknowledged experts in their specialized fields. Offers a superlative overview of current research and technology in diverse areas running the gamut from environmental problems to depth profiling and semiconductors.
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Consists of over 200 papers by acknowledged experts in their specialized fields. Offers a superlative overview of current research and technology in diverse areas running the gamut from environmental problems to depth profiling and semiconductors.
Read Less
Add this copy of Secondary Ion Mass Spectrometry: Sims IX to cart. $146.95, very good condition, Sold by Salish Sea Books rated 5.0 out of 5 stars, ships from Bellingham, WA, UNITED STATES, published 1994 by Wiley.
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Seller's Description:
Very Good; Hardcover; 1994, John Wiley Publishing; Minor shelfwear to covers; Pages clean & unmarked; Good binding; 1008 pages; "Secondary Ion Mass Spectrometry: SIMS IX, " by A. Benninghoven, et al.