The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical ...
Read More
The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical characterization methods, the more specialized optical, chemical and physical methods are also covered. Contains over 1,300 references.
Read Less
Add this copy of Semiconductor Material and Device Characterization to cart. $91.93, good condition, Sold by Goodwill of Silicon Valley rated 5.0 out of 5 stars, ships from San Jose, CA, UNITED STATES, published 2015 by Wiley-IEEE Press.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing page and cover creases as well as other types visible wear.
Add this copy of Semiconductor Material and Device Characterization to cart. $143.77, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2015 by Wiley-IEEE Press.
Add this copy of Semiconductor Material and Device Characterization to cart. $178.87, good condition, Sold by Book Words rated 5.0 out of 5 stars, ships from Midland Park, NJ, UNITED STATES, published 2015 by Wiley-IEEE Press.
Add this copy of Semiconductor Material and Device Characterization to cart. $179.87, good condition, Sold by TEXTSHUB rated 5.0 out of 5 stars, ships from Franklin Lakes, NJ, UNITED STATES, published 2015 by Wiley-IEEE Press.
Add this copy of Semiconductor Material and Device Characterization to cart. $187.53, new condition, Sold by GridFreed rated 5.0 out of 5 stars, ships from San Diego, CA, UNITED STATES, published 2015 by Wiley-IEEE Press.
Add this copy of Semiconductor Material and Device Characterization to cart. $195.58, new condition, Sold by Just one more Chapter rated 4.0 out of 5 stars, ships from Miramar, FL, UNITED STATES, published 2015 by Wiley-IEEE Press.
Add this copy of Semiconductor Material and Device Characterization to cart. $258.54, very good condition, Sold by Book Words rated 5.0 out of 5 stars, ships from Midland Park, NJ, UNITED STATES, published 2015 by Wiley-IEEE Press.
Add this copy of Semiconductor Material and Device Characterization to cart. $207.37, new condition, Sold by Books2anywhere rated 5.0 out of 5 stars, ships from Fairford, GLOUCESTERSHIRE, UNITED KINGDOM, published 2006 by Wiley.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
PLEASE NOTE, WE DO NOT SHIP TO DENMARK. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK.
