Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.
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Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.
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Add this copy of Test and Design-for-Testability in Mixed-Signal to cart. $64.59, good condition, Sold by Goodwill of Silicon Valley rated 5.0 out of 5 stars, ships from San Jose, CA, UNITED STATES, published 2004 by Springer.
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Add this copy of Test and Design-for-Testability in Mixed-Signal to cart. $106.46, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2004 by Springer.
Add this copy of Test and Design-for-Testability in Mixed-Signal to cart. $107.50, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2004 by Springer.
Add this copy of Test and Design-for-Testability in Mixed-Signal in to cart. $120.35, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2010 by Springer-Verlag New York Inc..
Add this copy of Test and Design-for-Testability in Mixed-Signal to cart. $121.30, new condition, Sold by Basi6 International rated 5.0 out of 5 stars, ships from Irving, TX, UNITED STATES, published 2004 by Springer.
