Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on.
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Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on.
Read Less
Add this copy of Testability Concepts for Digital Ics to cart. $115.43, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2012 by Springer-Verlag New York Inc..
Add this copy of Testability Concepts for Digital Ics to cart. $126.26, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2012 by Springer-Verlag New York Inc..
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Fine. Contains: Unspecified. Frontiers in Electronic Testing . Includes unspecified. Intended for professional and scholarly audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
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