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276. Microcantilevers for Atomic Force Microscope Data Storage
by Chui, Benjamin W
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1998, Springer
ISBN-13: 9780792383581
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277. Microcantilevers for Atomic Force Microscope Data Storage
by Chui, Benjamin W
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1998, Springer
ISBN-13: 9780792383581
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278. The Gap Symmetry and Fluctuations in High-Tc Superconductors
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1998, Springer
ISBN-13: 9780306459344
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Wahlstedt, S-H, GERMANY
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279. Computational Atomic Physics: Electron and Positron Collisions With Atoms and Ions
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1996, Springer
ISBN-13: 9783540601791
hardcover, New
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280. Monte Carlo Modeling for Electron Microscopy and Microanalysis
by Joy, David C
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1995, Oxford University Press
ISBN-13: 9780195088748
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281. Monte Carlo Modeling for Electron Microscopy and Microanalysis
by Joy, David C
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1995, Oxford University Press
ISBN-13: 9780195088748
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282. Monte Carlo Modeling for Electron Microscopy and Microanalysis
by David C. Joy
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1995, Oxford University Press
ISBN-13: 9780195088748
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283. Monte Carlo Modeling for Electron Microscopy and Microanalysis
by David C. Joy
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1995, Oxford University Press Academic US
eBook ISBN: 9780195088748
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284. Monte Carlo Modeling for Electron Microscopy and Microanalysis
by Joy, David C
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1995, Oxford University Press
ISBN-13: 9780195088748
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285. Monte Carlo Modeling for Electron Microscopy and Microanalysis
by Joy, David C
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1995, Oxford University Press
ISBN-13: 9780195088748
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286. Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford Series in Optical and Imaging Sciences)
by Joy, David C.
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1995, Oxford University Press
ISBN-13: 9780195088748
hardcover, Good
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287. Monte Carlo Modeling for Electron Microscopy and Microanalysis
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1995, Oxford University Press
ISBN-13: 9780195088748
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288. Monte Carlo Modeling for Electron Microscopy and Microanalysis
by Joy, David C
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1995, Oxford University Press
ISBN-13: 9780195088748
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289. Monte Carlo Modeling for Electron Microscopy and Microanalysis: 9 (Oxford Series in Optical and Imaging Sciences)
by Joy, David C.
Seller Description: New. A practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. The programs are optimized for use on personal computers, and are developed to deal with typical applications including secondary. Series: Oxford Series in Optical & Imaging Sciences. Num Pages: 224 pages, line figures, tables. BIC Classification: PBT; PDND; UGK. Category: (P) Professional & Vocational. Dimension: 243 x 161 x 21. Weight in Grams: 517. ... See More Details
1995, Oxford University Press
ISBN-13: 9780195088748
Hardcover, New
Galway, IRELAND
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290. Monte Carlo Modeling for Electron Microscopy and Microanalysis
by Joy, David C
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1995, Oxford University Press
ISBN-13: 9780195088748
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Castle Donington, DERBYSHIRE, UNITED KINGDOM
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