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301. Statistical Inference Via Data Science: a Moderndive Into R and the Tidyverse (Chapman & Hall/Crc the R Series)
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302. Pattern Recognition. Icpr 2024 International Workshops and Challenges: Kolkata, India, December 1, 2024, Proceedings, Part IV
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303. Pattern Recognition. ICPR 2024 International Workshops and Challenges: Kolkata, India, December 1, 2024, Proceedings, Part II
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304. Pattern Recognition. ICPR 2024 International Workshops and Challenges: Kolkata, India, December 1, 2024, Proceedings, Part VI
by Palaiahnakote, Shivakumara (Editor), and Schuckers, Stephanie (Editor), and Ogier, Jean-Marc (Editor)
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305. Feature Extraction and Image Processing for Computer Vision
by Mark Nixon; Alberto S. Aguado
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306. Proceedings of the 15th International Conference on Soft Computing and Pattern Recognition (Socpar 2023)
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307. Statistical Inference Via Data Science: a Moderndive Into R and the Tidyverse (Chapman & Hall/Crc the R Series)
by Kim, Albert Y.
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308. Introduction to Biometrics
by Ross, Arun A.
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309. Foundations of Robotics
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310. Statistical Inference Via Data Science
by Chester Ismay
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311. Applied Intelligence: Second International Conference, ICAI 2024, Zhengzhou, China, November 22-25, 2024, Proceedings, Part I
by Huang, De-Shuang (Editor), and Chen, Wei (Editor), and Zhang, Chuanlei (Editor)
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312. Applied Intelligence: Second International Conference, ICAI 2024, Zhengzhou, China, November 22-25, 2024, Proceedings, Part II
by Huang, De-Shuang (Editor), and Chen, Wei (Editor), and Zhang, Chuanlei (Editor)
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313. Applied Intelligence: Second International Conference, ICAI 2024, Zhengzhou, China, November 22-25, 2024, Proceedings, Part I
by Huang, De-Shuang (Editor), and Chen, Wei (Editor), and Zhang, Chuanlei (Editor)
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314. Applied Intelligence: Second International Conference, ICAI 2024, Zhengzhou, China, November 22-25, 2024, Proceedings, Part II
by Huang, De-Shuang (Editor), and Chen, Wei (Editor), and Zhang, Chuanlei (Editor)
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315. Applied Intelligence: Second International Conference, ICAI 2024, Zhengzhou, China, November 22-25, 2024, Proceedings, Part II
by Huang, De-Shuang (Editor), and Chen, Wei (Editor), and Zhang, Chuanlei (Editor)
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316. Introduction to Biometrics
by Jain, Anil K.
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