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351. Advanced Test Methods for Srams
Seller Description: Brand New. New. See More Details
2009, Springer
ISBN-13: 9781441909374
New Delhi, DELHI, INDIA
$81.33
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352. Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by Bosio, Alberto, and Dilillo, Luigi, and Girard, Patrick
Seller Description: New. Glued binding. Paper over boards. 171 p. Contains: Unspecified, Tables, black & white, Figures. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
2009, Springer
ISBN-13: 9781441909374
Hardcover, New
Castle Donington, DERBYSHIRE, UNITED KINGDOM
$116.83
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353. Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by Bosio, Alberto, and Dilillo, Luigi, and Girard, Patrick
Seller Description: New. Glued binding. Paper over boards. 171 p. Contains: Unspecified, Tables, black & white, Figures. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
2009, Springer
ISBN-13: 9781441909374
Hardcover, New
Columbia, MD, USA
$123.32
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354. Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by Bosio, Alberto
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2009, Springer
ISBN-13: 9781441909374
hardcover, Good
Santa Clarita, CA, USA
$144.04
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355. Dram Circuit Design
by Brent Keeth
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2007, Wiley
ISBN-13: 9780470184752
Hardcover, New
Fairford, GLOUCESTERSHIRE, UNITED KINGDOM
$153.40
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356. DRAM Circuit Design: Fundamental and High-Speed Topics
by Keeth, Brent, and Baker, R Jacob, and Johnson, Brian
Seller Description: New. Sewn binding. Paper over boards. 440 p. Contains: Unspecified, Illustrations, black & white, Tables, black & white, Figures. IEEE Press Microelectronic Systems. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, ... See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, New
Castle Donington, DERBYSHIRE, UNITED KINGDOM
$153.73
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357. DRAM Circuit Design: Fundamental and High-Speed Topics
by Keeth, Brent, and Baker, R Jacob, and Johnson, Brian
Seller Description: New. Sewn binding. Paper over boards. 440 p. Contains: Unspecified, Illustrations, black & white, Tables, black & white, Figures. IEEE Press Microelectronic Systems. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, ... See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, New
Columbia, MD, USA
$166.94
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358. Dram Circuit Design Fundamentals and High-Speed Topics
Seller Description: 100% BRAND NEW US Edition / Mint condition / Never been read / HARDCOVER / Student 2nd Edition / ISBN: 0470184752. Shipped out in one business day with free tracking. See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, New
Houston, TX, USA
$166.95
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359. DRAM Circuit Design: Fundamental and High-Speed Topics
by Keeth, Brent, and Baker, R Jacob, and Johnson, Brian
Seller Description: New. Sewn binding. Paper over boards. 440 p. Contains: Unspecified, Illustrations, black & white, Tables, black & white, Figures. IEEE Press Microelectronic Systems. See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, New
Uxbridge, MIDDLESEX, UNITED KINGDOM
$179.30
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360. DRAM Circuit Design: Fundamental and High-Speed Topics
by Keeth, Brent, and Baker, R Jacob, and Johnson, Brian
Seller Description: New. Sewn binding. Paper over boards. 440 p. Contains: Unspecified, Illustrations, black & white, Tables, black & white, Figures. IEEE Press Microelectronic Systems. See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, New
Southport, MERSEYSIDE, UNITED KINGDOM
$191.59
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361. Dram Circuit Design: Fundamental and High-Speed Topics (Ieee Press Series on Microelectronic Systems)
by Johnson, Brian
Seller Description: Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book. See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
hardcover, Good
Santa Clarita, CA, USA
$223.75
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362. DRAM Circuit Design: Fundamental and High-Speed Topics
by Keeth, Brent, and Baker, R Jacob, and Johnson, Brian
Seller Description: Fine. Sewn binding. Paper over boards. 440 p. Contains: Unspecified, Illustrations, black & white, Tables, black & white, Figures. IEEE Press Microelectronic Systems. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, ... See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, Fine/Like New
Columbia, MD, USA
$225.55
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363. DRAM Circuit Design: Fundamental and High-Speed Topics
by Keeth, Brent, and Baker, R Jacob, and Johnson, Brian
Seller Description: Fine. Sewn binding. Paper over boards. 440 p. Contains: Unspecified, Illustrations, black & white, Tables, black & white, Figures. IEEE Press Microelectronic Systems. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, ... See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, Fine/Like New
Castle Donington, DERBYSHIRE, UNITED KINGDOM
$245.84
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364. Dram Circuit Design: Fundamental and High-Speed Topics
by Keeth, Brent; Baker, R. Jacob; Johnson, Brian; Lin, Feng
Seller Description: New. Size: 8x6x0; New. In shrink wrap. Looks like an interesting title! See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, New
San Diego, CA, USA
$248.86
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365. Dram Circuit Design
by Brent Keeth
Seller Description: New. DRAM Circuit Design, Second Edition brings students and practicing chip designers an easy-to-follow, yet thorough, introductory to the subject. Focusing on the chip designer rather than the end-user, this Second Edition offers expanded, up-to-date coverage of DRAM circuit design by presenting both standard and high-speed implementations. Editor(s): Matter, Mary. Series: IEEE Press Series on Microelectronic Systems. Num Pages: 440 pages, Illustrations. BIC Classification: TJFC. Category: ... See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, New
Galway, IRELAND
$286.54
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366. DRAM Circuit Design: Fundamental and High-Speed Topics
by Keeth, Brent, and Baker, R Jacob, and Johnson, Brian
Seller Description: New. Sewn binding. Paper over boards. 440 p. Contains: Unspecified, Illustrations, black & white, Tables, black & white, Figures. IEEE Press Microelectronic Systems. See More Details
2007, Wiley-IEEE Press
ISBN-13: 9780470184752
Hardcover, New
MUMBAI, MH, INDIA
$292.36
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367. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing, 26)
by Hamdioui, Said
Seller Description: Good. Former library 2004 hardcover no dust jacket as issued withdrawn stamp in book/on edge of pages clean text no markings has call label on bottom of bind Published by Kluwer Academic 221 pages H-9. See More Details
2004, Springer
ISBN-13: 9781402077524
Hardcover, Good
Ocala, FL, USA
$49.32
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368. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing, 26)
by Hamdioui, Said
Seller Description: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! See More Details
2004, Springer
ISBN-13: 9781402077524
Hardcover, Good
Dallas, TX, USA
$61.90
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