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376. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing, 26)
by Hamdioui, Said
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2004, Springer
ISBN-13: 9781402077524
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377. Testing Static Random Access Memories
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2004, Springer
ISBN-13: 9781402077524
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378. Testing Static Random Access Memories
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2004, Springer
ISBN-13: 9781402077524
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379. Testing Static Random Access Memories
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2004, Springer
ISBN-13: 9781402077524
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380. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing)
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2004, Springer
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381. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing)
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2004, Springer
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382. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
by Hamdioui, Said
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2004, Springer
ISBN-13: 9781402077524
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383. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing)
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2004, Springer
ISBN-13: 9781402077524
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384. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing)
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2004, Springer
ISBN-13: 9781402077524
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385. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
by Hamdioui, Said
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2004, Springer
ISBN-13: 9781402077524
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386. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
by Hamdioui, Said
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2004, Springer
ISBN-13: 9781402077524
Hardcover, Fine/Like New
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387. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing, 26)
by Hamdioui, Said
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2004, Springer
ISBN-13: 9781402077524
hardcover, Good
Santa Clarita, CA, USA
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388. Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories (Prentice Hall Modern Semiconductor Design Series)
by Chakraborty, Kanad
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2002, Prentice Hall PTR
ISBN-13: 9780130084651
Waltham Abbey, ESSEX, UNITED KINGDOM
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389. Dram Circuit Design: a Tutorial (Ieee Press Series on Microelectronic Systems)
by Brent Keeth; R. Jacob Baker
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2000, Wiley-IEEE Press
ISBN-13: 9780780360143
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390. Dram Circuit Design: a Tutorial (Ieee Press Series on Microelectronic Systems)
by Baker, R. Jacob
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2000, Wiley-IEEE Press
ISBN-13: 9780780360143
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391. Dram Circuit Design: a Tutorial (Ieee Press Series on Microelectronic Systems)
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2000, Wiley-IEEE Press
ISBN-13: 9780780360143
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392. Dram Circuit Design: a Tutorial (Ieee Press Series on Microelectronic Systems)
by Keeth, Brent; Baker, R. Jacob
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2000, Wiley-IEEE Press
ISBN-13: 9780780360143
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393. Dram Circuit Design: a Tutorial (Ieee Press Series on Microelectronic Systems)
by Baker, R. Jacob
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2000, Wiley-IEEE Press
ISBN-13: 9780780360143
hardcover, New
Miramar, FL, USA
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394. Mega-Bit Memory Technology-From Mega-Bit to Giga-Bit
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1998, Taylor & Francis
eBook ISBN: 9789056990985
Edition: 1st edition
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