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276. Defect and Microstructure Analysis By Diffraction
by Snyder, Robert
Seller Description: PLEASE NOTE, WE DO NOT SHIP TO DENMARK. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK. See More Details
2000, Oxford University Press
ISBN-13: 9780198501893
Hardcover, New
Fairford, GLOUCESTERSHIRE, UNITED KINGDOM
$419.64
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277. Defect and Microstructure Analysis by Diffraction
by Snyder, R L, and Bunge, Hans J
Seller Description: New. Sewn binding. Cloth over boards. 808 p. International Union of Crystallography Monographs on Crystal, 10. See More Details
2000, OUP Oxford
ISBN-13: 9780198501893
Hardcover, New
Uxbridge, MIDDLESEX, UNITED KINGDOM
$421.84
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278. Defect and Microstructure Analysis by Diffraction
by Snyder, R L, and Bunge, Hans J
Seller Description: Fine. Sewn binding. Cloth over boards. 808 p. International Union of Crystallography Monographs on Crystal, 10. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
2000, OUP Oxford
ISBN-13: 9780198501893
Hardcover, Fine/Like New
Columbia, MD, USA
$434.51
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279. Defect and Microstructure Analysis by Diffraction
by Snyder, R L, and Bunge, Hans J
Seller Description: New. Sewn binding. Cloth over boards. 808 p. International Union of Crystallography Monographs on Crystal, 10. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
2000, OUP Oxford
ISBN-13: 9780198501893
Hardcover, New
Columbia, MD, USA
$438.83
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280. Defect and Microstructure Analysis By Diffraction
by Snyder, Robert
Seller Description: New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK. See More Details
2000, Oxford University Press
ISBN-13: 9780198501893
Hardcover, New
Bensenville, IL, USA
$452.17
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281. Defect and Microstructure Analysis by Diffraction
by Snyder, R L, and Bunge, Hans J
Seller Description: New. Print on demand Sewn binding. Cloth over boards. 808 p. International Union of Crystallography Monographs on Crystal, 10. See More Details
2000, OUP Oxford
ISBN-13: 9780198501893
Hardcover, New
NV, USA
$454.75
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282. Defect and Microstructure Analysis by Diffraction
by Snyder, Robert L, and Fiala, Jaroslav, and Bunge, Hans J
Seller Description: New. Sewn binding. Cloth over boards. 808 p. International Union of Crystallography Monographs on Crystal, 10. See More Details
2000, Intl Union of Crystallography
ISBN-13: 9780198501893
Hardcover, New
Southport, MERSEYSIDE, UNITED KINGDOM
$469.97
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283. Defect and Microstructure Analysis By Diffraction
by . Ed(S): Snyder, Robert; Fiala, Jaroslav; Bunge, Hans J.
Seller Description: New. Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction. Editor(s): Snyder, Robert; Fiala, Jaroslav; Bunge, Hans J. Series: International Union of Crystallography-Monographs on Crystallography. Num Pages: 808 pages, numerous ... See More Details
2000, Intl Union of Crystallography
ISBN-13: 9780198501893
Hardcover, New
Galway, IRELAND
$482.82
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284. High Resolution X-Ray Diffractometry and Topography
by D.K. Bowen; Brian K. Tanner
eBook See More Details
1998, Taylor & Francis
eBook ISBN: 9780850667585
Edition: 1st edition
Format: EPUB eBook
Digital download
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285. High Resolution X-Ray Diffractometry and Topography
by Bowen, D. K. & Brian K. Tanner
Seller Description: Very Good. 0850667585. Gift inscription by Author to fly leaf. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Inside pages are clean.; 24.6 X 17.4 X 1.56 centimeters; 264 pages. See More Details
1998, CRC Press
ISBN-13: 9780850667585
Hardcover, Very Good
Pflugerville, TX, USA
$104.95
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286. High Resolution X-Ray Diffractometry and Topography
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1998, CRC Press
ISBN-13: 9780850667585
New Delhi, DELHI, INDIA
$169.13
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287. High Resolution X-Ray Diffractometry and Topography
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1998, CRC Press
ISBN-13: 9780850667585
Irving, TX, USA
$181.01
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288. High Resolution X-Ray Diffractometry and Topography
by Bowen, D.K.; Tanner, Brian K.
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1998, CRC Press
ISBN-13: 9780850667585
Hardcover, New
San Diego, CA, USA
$204.20
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289. High Resolution X-Ray Diffractometry and Topography
by Bowen, D K, and Tanner, Brian K
Seller Description: New. Sewn binding. Cloth over boards. 262 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
1998, CRC Press
ISBN-13: 9780850667585
Hardcover, New
Castle Donington, DERBYSHIRE, UNITED KINGDOM
$235.85
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290. High Resolution X-Ray Diffractometry and Topography
by Bowen, D K, and Tanner, Brian K
Seller Description: Fine. Sewn binding. Cloth over boards. 262 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
1998, CRC Press
ISBN-13: 9780850667585
Hardcover, Fine/Like New
Castle Donington, DERBYSHIRE, UNITED KINGDOM
$235.85
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291. High Resolution X-Ray Diffractometry and Topography
by Bowen, D K, and Tanner, Brian K
Seller Description: New. Sewn binding. Cloth over boards. 262 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
1998, CRC Press
ISBN-13: 9780850667585
Hardcover, New
Columbia, MD, USA
$248.57
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292. High Resolution X-Ray Diffractometry and Topography
by Bowen, D K, and Tanner, Brian K
Seller Description: Fine. Sewn binding. Cloth over boards. 262 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers. See More Details
1998, CRC Press
ISBN-13: 9780850667585
Hardcover, Fine/Like New
Columbia, MD, USA
$248.57
