Edition
ISBN:
0471280283 /
ISBN-13:
9780471280286
Book Details
Seller
Sort
U.K./EUR Sellers
Price: Low to High
Price: High to Low
Condition
Condition: Reverse
Pub Date
Pub Date: Reverse
Sellers Near Me
Hardcover,
Good
Reliability and Degradation: Semiconductor Devices and Circuits (the Wiley Series in Solid State Devices and Circuits)
by Howes, M. J.
1981, J. Wiley
ISBN-13:
9780471280286
See Item Details ▾
Bonita
HIGH
Santa Clarita,
CA,
USA
$49.45
$80.56
Add to Basket
Add this copy of Reliability and Degradation: Semiconductor Devices and to cart. $49.45, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1981 by J. Wiley.
Edition: 1981, J. Wiley
Hardcover,
Good
Details: ISBN:
0471280283
ISBN-13:
9780471280286
Publisher:
J. Wiley
Published:
1981
Language:
English
Alibris ID:
18910263570
Shipping Options: Standard Shipping: $4.88
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Hide Details ▴
Hardcover,
Very Good
Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices & Circuits)
by Howes, M. J.; Morgan, David Vernon
1981, U.S.A. : John Wiley & Sons Ltd
ISBN-13:
9780471280286
See Item Details ▾
BingoBooks2
HIGH
Vancouver,
WA,
USA
$71.20
$80.56
Add to Basket
Add this copy of Reliability and Degradation: Semiconductor Devices and to cart. $71.20, very good condition, Sold by BingoBooks2 rated 4.0 out of 5 stars, ships from Vancouver, WA, UNITED STATES, published 1981 by U.S.A. : John Wiley & Sons Ltd.
Edition: 1981, U.S.A. : John Wiley & Sons Ltd
Hardcover,
Very Good
Details: ISBN:
0471280283
ISBN-13:
9780471280286
Edition:
1st Edition
Publisher:
U.S.A. : John Wiley & Sons Ltd
Published:
1981
Language:
English
Alibris ID:
13481248961
Shipping Options: Standard Shipping: $4.88
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Very Good in Very Good jacket. Hardback book and dust jacket in very good-plus condition, from private company library.
Hide Details ▴
Hardcover,
New
Reliability and Degradation: Semiconductor Devices and Circuits (the Wiley Series in Solid State Devices and Circuits)
by Howes, M. J.
1981, J. Wiley
ISBN-13:
9780471280286
See Item Details ▾
Just one more Chapter
HIGH
Miramar,
FL,
USA
$81.08
Add to Basket
Add this copy of Reliability and Degradation: Semiconductor Devices and to cart. $81.08, new condition, Sold by Just one more Chapter rated 4.0 out of 5 stars, ships from Miramar, FL, UNITED STATES, published 1981 by J. Wiley.
Edition: 1981, J. Wiley
Hardcover,
New
Details: ISBN:
0471280283
ISBN-13:
9780471280286
Publisher:
J. Wiley
Published:
1981
Language:
English
Alibris ID:
18705756383
Shipping Options: Standard Shipping: $4.88
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New.
Hide Details ▴
