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ISBN: 9780387400921
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0387400923 /
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9780387400921
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
by Pietsch, Ullrich, and Holy, Vaclav, and Baumbach, Tilo
2004, Springer
ISBN-13:
9780387400921
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Add this copy of High-Resolution X-Ray Scattering: From Thin Films to to cart. $161.27, new condition, Sold by Ria Christie Books rated 5.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 2004 by Springer.
Edition:
2004, Springer
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Available Copies: 10+
Details:
ISBN:
0387400923
ISBN-13:
9780387400921
Edition:
2nd 2004 edition
Publisher:
Springer
Published:
2004
Language:
English
Alibris ID:
18990148875
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Seller's Description:
New. Sewn binding. Cloth over boards. 408 p. Contains: Unspecified, Illustrations, black & white, Figures. Advanced Texts in Physics.
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Hardcover,
New
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
by Pietsch, Ullrich, and Holy, Vaclav, and Baumbach, Tilo
2004, Springer
ISBN-13:
9780387400921
See Item Details ▾
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NV, USA
$140.50
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Add this copy of High-Resolution X-Ray Scattering: From Thin Films to to cart. $140.50, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2004 by Springer.
Edition:
2004, Springer
Hardcover,
New
Available Copies: 10+
Details:
ISBN:
0387400923
ISBN-13:
9780387400921
Edition:
2nd 2004 edition
Publisher:
Springer
Published:
2004
Language:
English
Alibris ID:
10625200464
Shipping Options:
Standard Shipping: $4.88
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Print on demand Sewn binding. Cloth over boards. 408 p. Contains: Unspecified, Illustrations, black & white, Figures. Advanced Texts in Physics.
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