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ISBN: 9781441923066
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Scanning Probe Microscopy
2010, Springer
ISBN-13:
9781441923066
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Edition: 2010, Springer
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Details: ISBN:
1441923063
ISBN-13:
9781441923066
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Springer
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2010
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English
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
by Foster, Adam, and Hofer, Werner A
2010, Springer
ISBN-13:
9781441923066
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Add this copy of Scanning Probe Microscopy: Atomic Scale Engineering by to cart. $168.69, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2010 by Springer.
Edition: 2010, Springer
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Details: ISBN:
1441923063
ISBN-13:
9781441923066
Publisher:
Springer
Published:
2010
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English
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12382835438
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Seller's Description: New. Print on demand Trade paperback (US). Glued binding. 282 p. Contains: Unspecified. Nanoscience and Technology.
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Scanning Probe Microscopy
2010, Springer
ISBN-13:
9781441923066
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Edition: 2010, Springer
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Details: ISBN:
1441923063
ISBN-13:
9781441923066
Publisher:
Springer
Published:
2010
Language:
English
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18965396784
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Scanning Probe Microscopy
2010, Springer
ISBN-13:
9781441923066
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$128.70
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Add this copy of Scanning Probe Microscopy to cart. $128.70, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2010 by Springer.
Edition: 2010, Springer
Paperback,
New
Available Copies: 10
Details: ISBN:
1441923063
ISBN-13:
9781441923066
Publisher:
Springer
Published:
2010
Language:
English
Alibris ID:
18980164962
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