Edition
ISBN:
0792396588 /
ISBN-13:
9780792396581
Book Details
Seller
Sort
U.K./EUR Sellers
Price: Low to High
Price: High to Low
Condition
Condition: Reverse
Pub Date
Pub Date: Reverse
Sellers Near Me
Hardcover,
New
Testability Concepts for Digital ICS: The Macro Test Approach
by Beenker, F P M, and Bennetts, R G, and Thijssen, A P
1995, Springer
ISBN-13:
9780792396581
See Item Details ▾
Ria Christie Books
BEST
Uxbridge,
MIDDLESEX,
UNITED KINGDOM
$192.20
Add to Basket
Add this copy of Testability Concepts for Digital ICS: The Macro Test to cart. $192.20, new condition, Sold by Ria Christie Books rated 5.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 1995 by Springer.
Edition: 1995, Springer
Hardcover,
New
Available Copies: 10+
Details: ISBN:
0792396588
ISBN-13:
9780792396581
Edition:
1995 edition
Publisher:
Springer
Published:
1995
Language:
English
Alibris ID:
18878777807
Shipping Options: Standard Shipping: $4.89
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Sewn binding. Cloth over boards. 212 p. Contains: Unspecified. Frontiers in Electronic Testing, 3.
Hide Details ▴
New
Testability Concepts for Digital Ics
1995, Springer
ISBN-13:
9780792396581
See Item Details ▾
Basi6 International
BEST
Irving,
TX,
USA
$132.69
$169.99
Add to Basket
Add this copy of Testability Concepts for Digital Ics to cart. $132.69, new condition, Sold by Basi6 International rated 5.0 out of 5 stars, ships from Irving, TX, UNITED STATES, published 1995 by Springer.
Edition: 1995, Springer
New
Available Copies: 10
Details: ISBN:
0792396588
ISBN-13:
9780792396581
Edition:
1995 edition
Publisher:
Springer
Published:
1995
Language:
English
Alibris ID:
18976575769
Shipping Options: Standard Shipping: $4.89
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New, US edition. Satisfaction guaranteed! !
Hide Details ▴
Hardcover,
New
Testability Concepts for Digital ICS: The Macro Test Approach
by Beenker, F P M, and Bennetts, R G, and Thijssen, A P
1995, Springer
ISBN-13:
9780792396581
See Item Details ▾
Alibris
BEST
NV, USA
$168.69
Add to Basket
Add this copy of Testability Concepts for Digital ICS: The Macro Test to cart. $168.69, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 1995 by Springer.
Edition: 1995, Springer
Hardcover,
New
Available Copies: 10+
Details: ISBN:
0792396588
ISBN-13:
9780792396581
Edition:
1995 edition
Publisher:
Springer
Published:
1995
Language:
English
Alibris ID:
10104134025
Shipping Options: Standard Shipping: $4.89
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Sewn binding. Cloth over boards. 212 p. Contains: Unspecified. Frontiers in Electronic Testing, 3.
Hide Details ▴
Hardcover,
Good
Testability Concepts for Digital Ics: the Macro Test Approach (Frontiers in Electronic Testing, 3)
by Beenker, F.P.M.
1995, Springer
ISBN-13:
9780792396581
See Item Details ▾
Bonita
HIGH
Santa Clarita,
CA,
USA
$87.85
$169.99
Add to Basket
Add this copy of Testability Concepts for Digital Ics: the Macro Test to cart. $87.85, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 1995 by Springer.
Edition: 1995, Springer
Hardcover,
Good
Details: ISBN:
0792396588
ISBN-13:
9780792396581
Edition:
1995 edition
Publisher:
Springer
Published:
1995
Language:
English
Alibris ID:
18093651242
Shipping Options: Standard Shipping: $4.89
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Hide Details ▴
New
Testability Concepts for Digital Ics
1995, Springer
ISBN-13:
9780792396581
See Item Details ▾
Educational Media Centre
HIGH
New Delhi,
DELHI,
INDIA
$115.09
$169.99
Add to Basket
Add this copy of Testability Concepts for Digital Ics to cart. $115.09, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 1995 by Springer.
Edition: 1995, Springer
New
Available Copies: 10
Details: ISBN:
0792396588
ISBN-13:
9780792396581
Edition:
1995 edition
Publisher:
Springer
Published:
1995
Language:
English
Alibris ID:
18979868848
Shipping Options: Standard Shipping: $4.89
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Brand New. New.
Hide Details ▴
Hardcover,
New
Testability Concepts for Digital Ics: the Macro Test Approach (Frontiers in Electronic Testing, 3)
by Bennetts, R.G.
1995, Springer
ISBN-13:
9780792396581
See Item Details ▾
Just one more Chapter
HIGH
Miramar,
FL,
USA
$127.69
$169.99
Add to Basket
Add this copy of Testability Concepts for Digital Ics: the Macro Test to cart. $127.69, new condition, Sold by Just one more Chapter rated 4.0 out of 5 stars, ships from Miramar, FL, UNITED STATES, published 1995 by Springer.
Edition: 1995, Springer
Hardcover,
New
Details: ISBN:
0792396588
ISBN-13:
9780792396581
Edition:
1995 edition
Publisher:
Springer
Published:
1995
Language:
English
Alibris ID:
18982212809
Shipping Options: Standard Shipping: $4.89
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New.
Hide Details ▴
